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We provide a complete series of the PC-based level testing services for the DRAM memory die, IC as well as system integration testing. Our own inventions of DRAM memory PC-based testing are based on BIOS software, probe card and DIMM modules. Although PC-based transmission is slower than on larger equipment its accuracy is much higher since the conditions are closer to the actual circumstances.

DRAM die test equipment uses a probe card to check the electric circuit quality of the die on the wafer. The main function is to conduct the IC test before the package is screened out the good dies.

DRAM die test software as follows:

  DRAM Capacity DRAM Architecture DRAM Category
1 16MB 1M*16 SDRAM & EDO
2

64MB

2M*32, 4M*16

SDRAM

3

128MB

8M*16, 16M*8

SDRAM、DDR

4

256MB

16M*16, 32M*8

SDRAM、DDR

5

512M

32M*16, 64M*8

DDR2

DRAM IC test services are mainly needed to confirm IC products meet the standard requirements of the function, speed, power, timing tolerance, heat dissipation …etc.

In our test plant, there are 200 sets of PC test-machines and all sorts of testing equipment as well as many memory test & software specialists.


While the memory IC is tested by the PC-based platform, the complete PC test is to be verified through software processing. The final IC usage differs from PC test environments such as DVD players and Routers. We provide custom system integration testing to ensure the memory IC does not exceed tolerances when used.